Electronic Devices And Circuits 6th Edition Solution Manual
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For testing of micro- and nano-scale electronic devices, the ECE Dept. has a variety of measurement, modeling and testing equipment. A wide variety of compact p-n junctions, both current and voltage biased, as well as PIN diodes are fabricated and tested. The 1000V DC test station is used for testing of the integrated circuits. The industrial test station is used for testing of larger, higher voltage transistors. The ECE Dept. also has a Microwave measurement system for probing for test points and a constant current source with a bias voltage input. The Department also has several micro- and nano-scale vacuum test devices. The 7S Digital T/R test system can test up to 35 simultaneous interconnections. The Xscale is a compact T/R loop test system with a power supply, system controller, digital I/O, analog I/O and PC interface. The MicroTCA is a T/R test system with a PC interface, a switch matrix, DC power supply, digital I/O and a 16 channel T/R oscilloscope. A variety of parametric testers and oscilloscopes are also available for testing transistor and capacitor parameters.
The ECE Dept. has two unique test systems for semiconductor film deposition. The first is a sputter deposition system that supplies an AC power supply or DC power supply to a target material. The device to be deposited is located in the deposition chamber and the measurement system is located outside of the chamber. The second is a microwave plasma enhanced chemical vapor deposition (PECVD) system that has a microwave generator, RF generator, vacuum chamber and a DC power supply. The PECVD system also provides a spectroscopic instrument to probe the chemical reaction and physical properties of the film. The Departments also has a vacuum evaporation system for depositing various films on semiconductor and high-K dielectric substrates.
Laboratory Measurement and Modeling for Optics is a cross-disciplinary effort to provide opto-electronic characterization and modeling capabilities for novel integrated opto-electronic systems. The primary instrumentation includes a custom-built, variable-wavelength, infrared spectrometer for in-situ measurement of samples and a grating spectrometer and photomultiplier tube for the spectroscopic measurements of bulk material samples. For high-speed measurements of new devices, a HFSS Modeler is provided along with a microcavity laser diode and a HFSS model. Optical modeling, simulation and measurements are performed for the new devices using commercial finite difference and finite element methods. The Lab also provides extended scope research and training for M.S. and Ph.D. students.
The Micro-Electro-Mechanical Systems (MEMS) laboratory is a one of a kind facility in the nation. This lab provides environmental testing of both the power and control systems of MEMS devices, and it provides manufacturing and test environments to develop and evaluate the production of MEMS devices. The production facility is capable of producing up to 15,000 MEMS devices a month. 827ec27edc